Chroma Ate Inc.TWSE: 2360

2025.07.31 Quarterly Results Presentation

· Issued by Chroma Ate Inc.
2025.2Q Earnings Conference Paul Ying, CFO Leo Huang, Chairman & CEO

31st July, 2025

1



Agenda



  • Financial Review

  • Operation Highlights

  • Q&A

3



FINANCIAL REVIEW

4



Year 2025.2Q Condensed Consolidated Income Statement



Condensed Consolidated P&L

(In Million NTD, except for EPS in NTD)

2025.2Q %

2025.1Q %

QoQ %

2024.2Q %

YoY %

Net Sales

6,455

100%

6,865 100%

(6%)

5,515 100%

17%

Consolidated Sales of Testing Equipment Business

6,292

97%

6,456 94%

(3%)

5,234 95%

20%

Consolidated Sales of MAS

94

2%

349 5%

(73%)

192 3%

(51%)

Others

69

1%

60 1%

15%

89 2%

(22%)

Cost of Goods Sold

(2,231)

(35%)

(2,717) (40%)

(18%)

(2,249) (41%)

(1%)

Gross Profit

4,224

65%

4,148 60%

2%

3,266 59%

29%

Operating Expenses:

General & Administration

(1,395)

(22%)

(1,378) (20%)

1%

(1,230) (22%)

13%

Research & Development

(632)

(9%)

(606) (9%)

4%

(522) (9%)

21%

Operating Income

2,197

34%

2,164 31%

2%

1,514 28%

45%

Non-Operating Income (Expenses), net

241

4%

433 6%

(44%)

291 5%

(17%)

Income (Loss) Before Tax

2,438

38%

2,597 37%

(6%)

1,805 33%

35%

Income Tax

(431)

(7%)

(441) (6%)

(2%)

(368) (7%)

17%

Net Income

2,007

31%

2,156 31%

(7%)

1,437 26%

40%

Net Income (Losses) Attributable To:

Shareholders of the Parent

1,953

30%

2,123 31%

(8%)

1,407 26%

39%

Noncontrolling Interests

54

1%

33 -

64%

30 -

80%

$ 2,007

31%

$ 2,156 31%

(7%)

$ 1,437 26%

40%

EPS (Basic)

$ 4.64

$ 5.03

(8%)

$ 3.34

39%

EPS (Diluted)

$ 4.60

$ 4.98

(8%)

$ 3.31

39%



5

Year 2025.1H Condensed Consolidated Income Statement



Condensed Consolidated P&L

(In Million NTD, except for EPS in NTD)

2025.1H %

2024.1H %

YoY %

Net Sales

13,320

100%

9,933 100%

34%

Consolidated Sales of Testing Equipment Business

12,748

96%

9,493 96%

34%

Consolidated Sales of MAS

443

3%

278 3%

59%

Others

129

1%

162 1%

(20%)

Cost of Goods Sold

(4,948)

(37%)

(4,100) (41%)

21%

Gross Profit

8,372

63%

5,833 59%

44%

Operating Expenses:

General & Administration

(2,774)

(21%)

(2,412) (24%)

15%

Research & Development

(1,237)

(9%)

(1,007) (10%)

23%

Operating Income

4,361

33%

2,414 24%

81%

Non-Operating Income (Expenses), net

674

5%

610 6%

10%

Income (Loss) Before Tax

5,035

38%

3,024 30%

67%

Income Tax

(872)

(7%)

(611) (6%)

43%

Net Income

4,163

31%

2,413 24%

73%

Net Income (Losses) Attributable To:

Shareholders of the Parent

4,076

31%

2,362 22%

73%

Noncontrolling Interests

87

-

51 1%

71%

$ 4,163

31%

$ 2,413 23%

73%

EPS (Basic)

$ 9.67

$ 5.61

72%

EPS (Diluted)

$ 9.58

$ 5.56

72%



Balance Sheet Highlights & Financial Ratio



Consolidated (In Million NTD)

2025. June 2024. Dec + / - %

Balance Sheet Highlights

Cash & Short Term Investments

7,456

5,040

48%

Inventory

6,135

5,458

12%

Short Term Debt

336

1,417

- 76%

Long Term Debt

2,325

2,108

10%

Shareholders Equity

24,486

25,450

- 4%

Total Assets

40,785

37,308

9%

Inventory Turnover (Day)

211

209

AR Turnover (Day)

75

87

AP Turnover (Day)

106

118

Net Debt to Equity (%)

Net Cash

Net Cash



ROE (%)

33%

22%

ROA (%)

21%

15%

Cash Position

2025.1H

2024.1H

YoY

EBITDA

5,460

3,423

60%

Cash Flow from Operation

2,742

2,994

(8%)



Free Cash Flow

2,185

2,228

(2%)

All ROE + ROA has been annualized.

Free Cash Flow = Net Cash Provided by Operating Activities + (Net Cash used by Investing Activities)



7

OPERATION HIGHLIGHT

8



2025.2Q & 1H Product Mix and Consolidated Sales Breakdown



(Unit: Million NTD)

2025.2Q

%

QoQ

YoY

2025.1H

%

YoY

2024

%

Test Instruments & Automatic Testing System (ATS)

2,698

51%

22%

55%

4,903

46%

44%

6,825

44%

Semiconductor / Photonics Test Solutions

2,202

41%

(15%)

18%

4,804

45%

57%

6,974

45%

Turnkey Solutions

123

2%

(18%)

(23%)

273

3%

(37%)

685

4%

Service & Others

315

6%

12%

-

597

6%

5%

1,168

7%

Total of Parent Company Sales

5,338

100%

2%

31%

10,577

100%

42%

15,652

100%

+ Sales from Overseas Operations &

Related Subsidiaries

954

(22%)

(17%)

2,171

8%

4,767

Chroma Consolidated Testing Equipment Business

6,292

97%

(3%)

20%

12,748

96%

34%

20,419

95%

MAS

94

2%

(73%)

(51%)

443

3%

59%

872

4%

Other Subsidiaries

69

1%

15%

(22%)

129

1%

(20%)

313

1%

Consolidated Sales

6,455

100%

(6%)

17%

13,320

100%

34%

21,604

97%



9

Year 2025 Guidance



In the first half of year 2025, Chroma continuously presented an outstanding growth compared to last year, the total consolidated sales revenues reached 13.3 billion NTD, which presented a growth of 34% YoY. The Parent Company sales in first half hit record high reached 10.6 billion, presented a growth of 42% YoY. Semiconductor sector continued to present a strong growth of 57% YoY, after a strong growth of 135% in year 2024.

Year 2025 Business Outlook:

  • The semiconductor / photonics sector will be still the major growth driver in second half, while the Test

    Instruments & ATS for power testing solutions expected to hit yearly record high in 2025.

  • Qualified Metrology equipment for Advanced Packaging and increasing demand of SLT from AI / HPC and autonomous driving are key drivers for Semiconductor / Photonics sector.

  • The growth of Test Instruments & ATS for power testing solutions are coming from AI server power related

    applications.



    10

    ‌Technology & Solution Milestones High Precision Test Solutions



    ‌Semiconductor Test Solutions

    3650-S2 3380 MXADO





    • 768pin

    • 12 slots

    • 15kVA

    • Floating

    • LB electronics

    • IC: SiC/Power/logic

      Designed for High Quality Audio Testing

    • 8 WG and 8 WD channels

    • 6Vpp audioband

    • High-performance bandwidth: 100kHz (WG) and 22kHz (WD)

      Applications:

    • Wired/wireless/Bluetooth audio devices, headphones, speakers



2023 2024 2025

3680 HDRF2


  • Internally Integrated

  • One-touch engagement

  • 4 Vector Signal Transceivers

  • 32 RF ports

  • 6Ghz Software Defined Radio

  • 200Mhz bandwidth

  • Supports various protocols: Bluetooth 5.2, Wi-Fi 6, LoRa, GPS

    3650-S2 HTMU


    Advanced Performance for Timing Test

    • 16 channels

    • High precision with nSec-

      level accuracy

    • Supports multiple testing modes

      Applications:

    • PMIC, industrial control chips, logic chips

      IC: SiC / Power / Logic / Wireless



      ‌IC System Level Test Solutions

      Temperature-forcing Systems

      18/36/54 sites



      Package size 5x5~ 120x150mm



      -40~+150@Tc, up to 2.9 kw @70 ℃ cooling capacity/site

      Model 31000R-L

      Sea Cobra-E G1

      Contact force up to 600kgf TSD/ Tsense function OHT integration

      Model 31000R-L

      Sea Cobra-E G2

      • -40℃~ +150℃ @Tc

      • Up to 1,800W power

      dissipation



      • -40℃~ +150℃ @Tc

      • Up to 2,900W power

        dissipation

      • Excellent RTGB and Spike response control

2024 2025

FT & SLT Hybrid Test System


SLT Handler System


Model 3200

  • 5x5~120x120mm

  • 4~24 sites

  • -40 ~ +150℃ @Tc, up to

    1.5kw/site dissipation

  • 500 kgf/site contact

  • Warpage detection

  • OHT integration

    Model 3200-HD



  • 5x5~120x150mm

  • 18/36/54 sites

  • -40 ~ +150℃ @Tc, up to

    2.9kW/site dissipation

  • 600 kgf/site contact

  • TSD/Tsense function integration

Advanced packaging of AI/HPC, automotive, IoT, cloud, network and data center chips



Photonics Test Solutions

PD/APD Burn-in System



Model 58606

  • Temp. : 40° ~ 180°C

  • DUT pad size > 70um

  • ±2mA; ±80V

HP LD Burn-in System



Model 58605

  • Temp. : 20° ~ 85°C

  • Up to 6Amps of Pulse Driving



LD Burn-in System





Model 58604-HD

  • Temp. : 40° ~ 150°C

  • 500mA SMU, 2,688ch per Rack

    2021 2023



    VCSEL Wafer Test System II

    Model 58636 series

    • Temp.: -20° ~ 100°C

    • LIV+NF two-in-one

    • Pulse width: hundreds ns to few us

    • Integrate digital control function

2025

OFC

Consumer/ Automotive Sensing; LiDAR





Semiconductor Test Solutions - Advanced Packaging







2D/3D Wafer Metrology Systems SOC Test

7980

7981

3680 Systems 3650-S2

Front-end Process: Wafer Fabrication

Middle-end Process: Advanced Packaging

Back-end Process: Assembly and Packaging

Lithography, etch, implant

Singulation

Redistribution

Bump

placement

Die attach

Overmold/ Underfill/ Encapsulation

Probe,

test

Wafer clean

Reconstitution

Die stacking

Singulation

Wire Bond



FT Handlers

SLT Handlers

3110-FT 3180 3200 3260



Technology & Solution Milestones High Power Test Solutions



AI Server Power Test Solutions



Power Supply Unit (PSU) Battery Backups



Power Shelf



Battery Backup Unit On-board DC-DC Converter



AI Server

(Source: Supermicro)

Regenerative Grid Simulator

DC Electronic Load

Power Conversion Device ATS

Bidirectional DC Source

DC Electronic Load

Model 61800

Model 61815

  • 15kVA

    Model 63200A Series

    • 2kW - 24kW

      Model 62000D Series

    • 0 - 2000V, 0 - 540A

    • 6kW - 45kW

      Model 62000D-HL Series

      Model 63202A-20-1000 63202A-20-2000

  • 2KW/Up to 2000A

    • 105kVA

      Model 8000 ATS

    • Up to 500kW

    • High range: 2000V/480A/360kW

    • Low range: 650V/1440A/360kW

    • High power system: up to 1.8MW

AI Server Battery Backup Unit Test Solutions

Battery Backup Unit



BBU Battery Pack





(Source: Supermicro)



Power Rack



BBU Shelf BBU Module BBU Battery Pack Battery pack BMS Battery Cell

Regenerative Battery Pack Test System

BBU Functional ATS

Battery pack ATS

Regenerative Battery Pack Test System

BMS functional ATS

Battery reliability test system

Model 17040E

Model 17050

Model 8000 ATS

Model 8720 ATS

Model 17020/E/C

Model 8710 ATS

Model 17010H

  • 200kW

  • 0 - 2000V

  • Up to 500kW

  • 60V

  • 60V

  • 16cell simulator

  • 5V

  • 850V

  • 0 - 540A

  • 6kW - 45kW, up to 500kW

  • 100~500A

  • 540A

  • 100~300A



Thank You

Copyright © 2023 Chroma ATE Inc. All rights reserve1d9.

Attention: This is an excerpt of the original content. To continue reading it, access the original document here.