Aehr Test Systems · NASDAQ:AEHR
Aehr Test Systems — Investor Presentation (August 2023)
20 slides from Aehr Test Systems's investor presentation, August 2023
Slide 1: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Nasdaq: AEHR
Slide 2: Forward Looking Statements
Forward Looking Statements This presentation contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties includ
Slide 3: Presenting Today
Presenting Today Gayn Erickson CEO, Aehr Test Systems
Slide 4: Record Fiscal Year 2023 Financial Results
Record Fiscal Year 2023 Financial Results l Total full year revenue grew 28% to a record $65 million l Bookings reached a record of $78.3 million l GAAP profit of $14.6 million and non-GAAP profit of $17.3 million were also records, growing 54% and 62% year over year, respectively. l Total cash, cas
Slide 5: Aehr Test Systems Market Drivers
Aehr Test Systems Market Drivers Need for cost-efficient wafer level and singulated die burn-in, stabilization, & testing are creating significant revenue opportunities for Aehr Test in the following key markets l Electric Vehicle & Electrification of Transportation Infrastructure driving motor cont
Slide 6: Update on Silicon Carbide Burn-in Market
Update on Silicon Carbide Burn-in Market l Aehr is well on way to becoming the industry standard for a critical manufacturing step for silicon carbide power semiconductors used in electric vehicle traction inverters that power EV engines. l Aehr’s FOX multi-wafer test and burn in systems with propri
Slide 7: Burn-in Testing – The Bathtub Curve
Burn-in Testing – The Bathtub Curve Example Silicon Carbide Failure Rate l Burn-in: A functional test in which electronic components are subject to > 10,000 ppm Decreasing Failure Rate Constant Failure Rate Increasing Failure Rate elevated voltages and/or Failure Rate temperatures for a duration of
Slide 8: SiC and Multi-Die Packages / Modules
SiC and Multi-Die Packages / Modules Package/Module yield loss cost much greater than cost of wafer level burn-in Tesla Traction Inverter with 24 2-die modules Lucid Traction Inverter Sil with 3 10-die modules ico nC arb ide 3-P Onsemi Traction Inverter ha se with 1 24-die module EV Tra cti on Inv e
Slide 9: FOX-XP Multi-Wafer Production Test & Burn-In System
FOX-XP Multi-Wafer Production Test & Burn-In System l 9 / 18 Wafer System for High Volume Production l 100% compatible using the same Blade resources as FOX-NP l Configurable for Gate, Drain, and Body Diode Stress tests l Integrated standard 20ºC to 150ºC thermal control unit l FOX WaferPak Contacto
Slide 10: Aehr Wafer Level Test & Burn-in Patents
Aehr Wafer Level Test & Burn-in Patents l WaferPak temperature control methods l Vacuum & pressure-based WaferPaks l Maintaining probe contact over temperature l Electrical components in WaferPak l Individual DUT power supplies l Per Die Current Protection l Redundant power supplies l Portable Wafer
Slide 11: Proprietary Wafer Level Enabling Technology
Proprietary Wafer Level Enabling Technology l Aehr’s FOX-XP is capable of both functional burn-in and test solutions – leverages proprietary aligner and contactor technology l Multi-wafer technology enables customers to achieve an overall decrease in test equipment cost and fab footprint – while inc
Slide 12: Testing without Compromise
Testing without Compromise Reliability, Stress, and DFT Testing without compromise l Solutions for package parts, modules, panels, or wafers allow testing at optimal process point l Confirm which devices received desired test with per device measurements, monitoring, & feedback l 100% traceability w
Slide 13: Critical SiC MOSFET Parameters & Stress Tests
Critical SiC MOSFET Parameters & Stress Tests Higher than acceptable extrinsic (infant mortality) failure rates of silicon carbide MOSFETs require 100% production stress / burn-in testing to achieve automotive V(BR)DSS Drain Source and industrial quality levels Breakdown Voltage Example Stress / Bur
Slide 14: Package Part vs Wafer Level Burn in
Package Part vs Wafer Level Burn in Package / Module Part Burn-in Wafer Level Burn-in x18 l Up to ~ 2,500 SiC devices per system l Up to ~ 45,000 SiC devices per system l Individual device handling with limited life l 1000s of devices handled at a time with micro-pogo sockets and scrub marks on devi
Slide 15: Update on Gallium Nitride Burn-in Market
Update on Gallium Nitride Burn-in Market l Engaged with multiple large and small semiconductor companies developing GaN based MOSFETs for electrification infrastructure used in AC to DC and DC to AC power conversion l GaN expected to grow enormously moving forward as it is faster, more effective, an
Slide 16: Update on Silicon Photonics Burn-in Market
Update on Silicon Photonics Burn-in Market l In FY23, we saw Silicon Photonics begin to recover after a low spell during the Pandemic l Shipments for the year were up x% Y/Y and bookings were up Y%. l Particularly excited about recent order for new higher power production system capable of testing a
Slide 17: Optical I/O is Coming…
Optical I/O is Coming… l “It was never about just … transceivers, it was about the learning curve because we knew that, down the road, optics needed to be co-packaged with Ethernet switches. And it will eventually be integrated with the CPU or XPU as well.” – Robert Blum, Senior Director of New Busi
Slide 18: 2023 Drivers and Applications Paradigm Shift
2023 Drivers and Applications Paradigm Shift Source: Co-packaged Optics for Datacenter 2023, Yole Inteligence, March 2023
Slide 19: Aehr’s New Fully Automated WaferPak Aligner
Aehr’s New Fully Automated WaferPak Aligner l Available in stand-alone as well as fully integrated with FOX-XP System configurations l Provides customers fully hands-free operation up to lights out SECS/GEM factory automation and integration l Expands Aehr markets & opportunities l Both stand-alone
Slide 20: Setting the Test Standard for Tomorrow
Setting the Test Standard for Tomorrow Nasdaq: AEHR
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