Aehr Test Systems · NASDAQ:AEHR
Aehr Test Systems — Investor Presentation (July 2014)
20 slides from Aehr Test Systems's investor presentation, Jul 9, 2014
Slide 1: Setting the Test Standard for Tomorrow
AEHR = TEST SYSTEMS — Setting the Test Standard for Tomorrow July 2014 Nasdaq: AEHR
Slide 2: Safe Harbor Statement
Safe Harbor Statement This presentation contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties include wit
Slide 3: Aehr Test Systems Company Overview
Aehr Test Systems Company Overview Leading provider of systems that reduce the cost of testing and reliability screening of integrated circuits (ICs) used in today’s cutting edge technology. e Listed on NASDAQ: AEHR e NewemergingIC test markets: e HQ in Fremont, CA e SSD Flash testing market: new $2
Slide 4: Substantial Emerging Opportunities
Substantial Emerging Opportunities e New EmergingIC Test Markets: e SSD Flash manufacturers ($200 - $300 million annual TAM opportunity): e Samsung e Hynix e Intel e Toshiba e Micron e SanDisk e Emerging AutoIC manufacturers ($50 - $75 million annual TAM opportunity): e nVidia e Sierra Wireless e TI
Slide 5: SSD Flash Cycling Market
SSD Flash Cycling Market NAND Application Share (2013) Other MP3. “799 3% Tablets_, 11% UFD 14% Flash Cards 20% ssD 21% Worldwide SSD Revenue ($B) 2011 2012 2013 2016 2018 2016 NAND Wafers by Application 20 ta0 | 160 120 | ns of 300mm equivalent) Wafer Starts Per Year 20 =e 2011 2012 2013 2014 2015
Slide 6: SSD Flash Wafer Level Cycling Yield Savings
SSD Flash Wafer Level Cycling Yield Savings NAND FLASH SSD - Stacked die yield loss w/o WLBI 8 Die Stack Yield Loss wio WLBI 98.5% - 92.3% > 6% 97.5% - 86.1% > 12% 96.5% - 74.4% > 22% 16 Die Stack Yield Loss wio WLBI 98.5% - 86.1% > 13% 97.5% -72.4% > 25% 96.5% - 61.4% > 35% 4 AEHR>=— TEST SYSTEMS —
Slide 7: Emerging Auto IC Test Market Opportunity
Emerging Auto IC Test Market Opportunity Automotive IC growth in sensors, control, information, and entertainment has substantially higher requirements for initial quality and long term reliability 5 AEHR TEST SYSTEMS
Slide 8: Emerging Auto IC Market Drivers
Emerging Auto IC Market Drivers New Automotive Technology Driving Automotive IC Test Market Growth
Slide 9: Our Products
Our Products ABTS Packaged Part Test & Burn-in Systems Cost-effective, reliable and highly configurable Test & Burn-in Systems FOX's (FULL waren cONTICT Unique solution for test & burn-in for KGD and Multiple Wafer Test & ti ti licati Burn-in Systems and automotive applications Contactors | alg FOV,
Slide 10: Significant Worldwide Customer Base
Significant Worldwide Customer Base We Texas INSTRUMENTS Manson Infineon RENESAS = eg MICRONAS is B= Sin ng hynix Few ais ADVANCED pee poscH AMEE O°": Omio; Ema maxim ‘SMicrocue = Si oid ST] er ae eo ASEGROUP = 2 freescale~ eRe UII COM TE Qua ‘ NANUA @ ciowaLrounories Over 2500 Systems Shipped World
Slide 11: AEHR Burn-in & Test Innovations
AEHR Burn-in & Test Innovations Logic ATS-12000 Dynamic Burn-in 1977 ATS-12000 Dynamic Burn-in MBT Test During Burn-in 1980s ATX Monitored Burn-in MTX APG Functional Test & Burn-in 1990s Monitored Burn-in ABTS-M APG Functional Test & Burn-in Today ABTS-LIP Functional Test & Burn-in AEHR>=— TEST SYST
Slide 12: Addressing Test & Burn-in Needs
Addressing Test & Burn-in Needs ABTS Advanced Burn-in and Test System ABTS Family of Packaged Part Test & Burn-in Systems e Automotive, Mobile Processors, Video/Graphics, 4G Comms, High Power SOCs, and Memory ICs e Proprietary family of high performance thermal chambers e Turn-key solution for indiv
Slide 13: ABTS / MAX Production Test Floor
ABTS / MAX Production Test Floor 7, wilt J " AEHR TEST SYSTEMS
Slide 14: FOX Full-Wafer Test Evolution
FOY Full-Wafer Test Evolution FUL WAFER COM Systems Lb 14 200mm Wafer Slots ‘Single 300mm Wafer 15 300mm Wafer Slots Air thermal control Liquid Cooled Liquid Thermal Control Liquid /Air Cooled Full Algo PG Full Algo or JTAG/BIST Vector or Algo PG Vector with JTAGIBIST 1995 2002 2006 2009 2014 Contac
Slide 15: FOX-XP Multi-Wafer Test & Burn-in
Fi 1,6 Multi-Wafer Test & Burn-in e Cost-effective Solution for Producing Known- Good-Die (KGD) e Stacked and Multi-Chip Packages e Zero-defect tolerant applications e Wafer Level Reliability test of automotive, communication, and mission critical ICs e Move packaged part test and burn-in to wafer t
Slide 16: For High Volume Manufacturing Floor
For High Volume Manufacturing Floor FULL WAFER CONTACT
Slide 17: FOX Full Wafer Test & Burn-in
FOY Full Wafer Test & Burn-in FUL WAFER COWTICT FOX-1 Family of Single Wafer Test & Burn-in Systems e Low Cost Wafer Test - More test is moving to wafer with additional DFT, BIST, and Higher Parallelism e Automotive ICs — Full wafer functional, stress, and burn-in test of automotive ICs e Discrete a
Slide 18: FOX-1 Production Test Floor
FOX-1 Production Test Floor
Slide 19: Investment Considerations
Investment Considerations Current TAM of $100 million expanding to $400 - $500 million New emerging IC test markets have no incumbent test providers: e SSD Flash testing market ($200 - $300 million annual TAM opportunity) e Emerging Auto IC testing market ($50 - $75 million annual TAM opportunity) e
Slide 20: Setting the Test Standard for Tomorrow
AEHR = TEST SYSTEMS — Setting the Test Standard for Tomorrow Nasdaq: AEHR
Aehr Test Systems — Investor Presentation (July 2014) on 6ix