Monolithic Power Systems, Inc. · NASDAQ:MPWR

Monolithic Power Systems — Technical Presentation (September 2020)

11 slides from Monolithic Power Systems's technical presentation, Sep 30, 2020

  1. Slide 1: How Automotive Mission Profiles Relate to Semiconductor Reliability Testing

    How Automotive Mission Profiles Relate to Semiconductor Reliability Testing Presenter: Thomas Eikenberg September 30th, 2020

  2. Slide 2: Agenda

    Agenda What Is a Mission Profile? Stress to the Silicon IC Qualification Assessment of Existing and Qualified Components Fail Mech, Models, Acceleration Factor Equivalent Qualification Stress Equivalent Qualification Stress – Example Open Q&A

  3. Slide 3: What is a Mission Profile?

    What is a Mission Profile? A Mission Profile is a mirror image of the expected life time of an application and the associated stress, which all used device will be submitted to. It is needed to estimate if all used device will be reliable enough to maintain the specified product performance at least

  4. Slide 4: Stress to the Silicon

    Stress to the Silicon What stress is it that the used devices will see during their life time? Thermo-Mechanical : the applications will be switched on/off and are used in winter and summer time etc. Voltage- and Temperature: Voltage (current) as well as temperature will cause aging effects to the s

  5. Slide 5: IC Qualification

    C Qualificatio Appendix Template 4A: AEC-0100 Qualification Test Plan ‘Q100H QUALIFICATION TEST PLAN. AEC - Q100- Rev-H Teens TSE SoRPSNNT ENE September 11, 2014 “SUPPLIER COMPA ‘SUPPLIER MANUFACTURING STES™ september 112014 SUPPUER PN 'PPAP SUBMISSION DATE SOPRUER FAMLY TPE EASON FOR QUALIFICATION

  6. Slide 6: Assessment of Existing and Qualified Components

    Assessment of Existing and Qualified Components AECQ100 defines that the Tier1 shall perform the assessment of the reliability capability on ECU level. AECQ100, Rev H; Figure A7.2: Flow Chart 2

  7. Slide 7: Fail Mech, Models, Acceleration Factor

    Fail Mech, Models, Acceleration Factor AECQ100, Rev G; Table A7.1: Basic Calculations for AEC-Q100 Stress Test Conditions and Durations AECQ100 also to a loading of “Humidity”, but this is typically not requested to us

  8. Slide 8: Equivalent Qualification Stress

    Equivalent Qualification Stress In order to check if a certain device is suitable for a given MP, the stress of the MP must be translated into equivalent qualification stress. Mission Profile Stress - > Equivalent Qual Stress > or < Qualification Stress The associated acceleration models “Arrhenius”

  9. Slide 9: Equivalent Qualification Stress - Example

    Equivalent Qualification Stress - Example 𝐸𝑎 1 1 𝐴𝑓 = exp ∗( − ) 𝑘𝑏 273 − 40 273 + 125 𝐴𝑓 = 4184927.76 𝑡𝑢 𝑡𝑡 = 𝐴𝑓 This calculation needs to be done for every 45ℎ profile increment and the total equivalent 𝑡𝑡 = 4184927.76 test time is the sum of all tts. For this Profile 1 the total…

  10. Slide 10: Equivalent Qualification Stress – Example cont’d

    Equivalent Qualification Stress – Example cont’d How to address this? • Either the actual Tj can be reduced in the application by implementing cooling/heat sink • Extend the qualification by prolonging the test time and/or the increase the Tj Using a qualification Tj of 150C the total equivalent tes

  11. Slide 11: Thanks !

    Thanks !

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