Analog Devices, Inc. · NASDAQ:ADI
Analog Devices — Technical Presentation (2021)
35 slides from Analog Devices's technical presentation, 2021
Slide 1: The Road to an All EV Future
The Road to an All EV Future Enabling Test & Measurement Solutions for Electric Vehicles David Rowe Derrick Hartmann Miguel Usach Marketing Director Product Applications Engineer System Applications Engineer Electronic Test & Measurement Precision Technology Group Precision Technology Group 1 ©2021
Slide 2: What we'd like to discuss today
What we’d like to ► Overview of Test & Measurement Challenges for Electric Vehicles discuss today. ► Application Examples ▪ Hardware in the Loop ▪ Inverter Test ▪ Datalogger & Protocol Analyzer ► Wrap-Up and Q&A 2 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 3: Instrumentation: Test & Measurement for Next-Generation Applications
Instrumentation TEST & MEASUREMENT FOR NEXT-GENERATION APPLICATIONS Electric Vehicles & Ubiquitous Connectivity Immersive Sustainability AI & ML Autonomous Mobility 5G, 6G and beyond Experience “If it’s not tested, it doesn’t work.” Solutions Integrating a Breadth of Technologies High Speed RF, Micr
Slide 4: Electrification and Autonomy
Electrification and Autonomy TRENDS Manufacturing Increasing Advanced R&D and manufacturing Capacity Investments enabling the future of mobility Accelerating EV/HEV Sales Battery Formation & Test Enabling wide-scale, high quality lithium ion battery production Level 3 Autonomous ADAS & Autonomy Vehi
Slide 5: What Is "Automotive Test"?
What Is “Automotive Test”? Test & measurement systems designed to test the components, modules, and subsystems of modern electric and autonomous vehicles. Intra-vehicle Communications On-Board Charger ADAS Systems Electronic Power Steering Inverter Traction Motor Electronic Suspension Battery Cells,
Slide 6: Automotive Test: Three Application Examples
Automotive Test: Three Application Examples Hardware In The Loop (HIL) ► Precision signal acquisition and excitation ► Optimized for signal bandwidth and lowest possible latency Dynamic Power Supply ► Enabling test of drivetrain components such as inverters, motors, and chargers ► High power isolate
Slide 7: Application Example: Hardware in the Loop
► Overview of Test & Measurement Application Challenges for Electric Vehicles Example: ► Application Examples ▪ Hardware in the Loop ▪ Inverter Test Hardware in the Loop ▪ Datalogger & Protocol Analyzer ► Wrap-Up and Q&A 7 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 8: Hardware in the Loop (HIL) Challenges
Hardware in the Loop (HIL) Challenges HIL Simulator ► Technique used for the testing of complex real-time systems. ▪ The “Simulator” is purpose built hardware+software Device under ▪ The “Simulator” emulates the related dynamic systems that Analog and Digital test (DUT) Analog and Digital interact w
Slide 9: Delivering Precision & Speed is in our DNA
Delivering Precision & Speed is in our DNA Acquisition AC and DC Performance Noise, Linearity, Bandwidth Loop Latency Latency, Settling Excitation 9 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 10: Analog Output Excitation Characteristics
Analog Output Excitation Characteristics ► Minimum “digital” delay ► Low output noise, tens of nV/Hz ► Low glitch, few nV-s ► Medium analog bandwidth, up to 1 MHz ► Resolution vs. settling time ▪ The higher the resolution, the higher the settling time Device Resolution Settling Time (0.1%) AD5445 1
Slide 11: High Resolution, Fast Excitation
High Resolution, Fast Excitation LTC6655 Key Value Propositions 0.25 PPM NOISE ► ±10 V output 2PPM/°C REF ► <150 ns analog latency ► ADI’s highest speed precision DAC Performance OPTIONAL ► Anchor: AD3552R-16 DAC AD3552R-16 AD8066 ADG5401F ▪ 16-bit resolution @ 30 MUPS 16 BIT IOUT DAC 30 MUPS DAC HI
Slide 12: Analog Input Acquisition Solutions
Analog Input Acquisition Solutions ► ADC latency is defined by the acquisition time and interface capabilities ▪ Rule of thumb: the higher the SPS, the lower the latency ► Latest SAR ADCs simplify the AFE design, Hi-Z input mode, and readback, Turbo mode ▪ AD4000 and AD4001: 16 bits, 2 MSPS ► Wide i
Slide 13: High Resolution, Fast Acquisition
High Resolution, Fast Acquisition Key Value Propositions ► >5 MSPS differential measurement where LTC6655 balance between bandwidth, noise, and 0.25 PPM NOISE 2PPM/°C REF power consumption is required ▪ NOTES: ▪ ADA4945-1 89.2 dB SINAD AC performance @ 100 kHz ▪ ADA4899-1 94.8 dB SINAD AC performanc
Slide 14: Compact and Fast Solution
Compact and Fast Solution Key Value Propositions LTC6655 0.25 PPM NOISE ► 15 MSPS differential measurement where 2PPM/°C REF balance between noise performance and density is required ▪ NOTES: ▪ ADAQ23875 87 dB SINAD AC performance @ 1 MHz ▪ LTC6373 suited to % of reading in range systems as THD decr
Slide 15: AD3542R/AD3552R: fastDAC Overview
AD3542R/AD3552R: fastDAC Overview ► Performance ▪ 16-bit resolution ▪ Up to 30 MUPS ▪ Ultralow glitch – 50pV-s SAMPLES ▪ Fast settling time AVAILABLE ▪ Large step: 160 ns @ 0.1% for a 2V step ▪ Small step: 100 ns @ 0.1% ▪ Zero latency ▪ Instantaneous DAC update EXTERNAL ▪ Multi spans with overrange,
Slide 16: ADAQ23876: 16-Bit, 15 MSPS SAR ADC with Signal Conditioning and Drive
ADAQ23876: 16-Bit, 15 MSPS, SAR ADC with Signal Conditioning and Drive Key Performance Specifications ► AC ▪ THD –112 dB at 1 kHz, –100 dB at 100 kHz ▪ SINAD 87.5 dB at 100 kHz ► DC ▪ INL ±0.6 LSB ▪ DNL ±0.3 LSB ▪ Gain error 0.01% ▪ Gain drift 1ppm/°C typ ▪ Transient response ▪ Full-scale step settl
Slide 17: Application Example: Dynamic Power Supply for Inverter Test
► Overview of Test & Measurement Application Challenges for Electric Vehicles Example: ► Application Examples ▪ Hardware in the Loop ▪ Dynamic Power Supply: Inverter Test Dynamic Power Supply for ▪ Datalogger & Protocol Analyzer Inverter Test ► Wrap-Up and Q&A 17 | ©2021 Analog Devices, Inc. All rig
Slide 18: Automotive Test: Dynamic Power Supply for Inverter Test
Automotive Test: Dynamic Power Supply for Inverter Test Load + Battery Inverter Power Emulator (EUT) Meter 18 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 19: Automotive Test: Dynamic Power Supply for Inverter Test
Automotive Test: Dynamic Power Supply for Inverter Test CT/xMR/Hall 3- Phase 440V Mains Vout+ Diodes or /220V ~ IGBT or Up to ~ SiC /110V ~ 1200V Switches x2-3 x2-3 Shunt Vout- Vsense+ +12V Half-Bridges Smoothing Circuit H-Bridge Resistor Resistor AC to DC -12V Dividers Dividers Conversion 5V Vsense
Slide 20: Inverter Test Power Path
Inverter Test Power Path CT/xMR/Hall 3- Phase 440V Mains Vout+ Diodes or /220V ~ IGBT or Up to ~ SiC /110V ~ 1200V Switches x2-3 x2-3 Shunt Vout- Vsense+ +12V Half-Bridges Smoothing Circuit H-Bridge Resistor Resistor AC to DC -12V Dividers Dividers Conversion 5V Vsense- Resistor Resistor Dividers AC
Slide 21: Inverter Test Data Acquisition and Gate Drive
Inverter Test Data Acquisition and Gate Drive CT/xMR/Hall 3- Phase 440V Mains Vout+ Diodes or /220V ~ IGBT or Up to ~ SiC /110V ~ 1200V Switches x2-3 x2-3 Shunt Vout- Vsense+ +12V Half-Bridges Smoothing Circuit H-Bridge Resistor Resistor AC to DC -12V Dividers Dividers Conversion 5V WolfSpeed Vsense
Slide 22: ADuM4146: SiC Isolated Gate Driver
ADuM4146: SiC Isolated Gate Driver 150 kV/μs CMTI, RDS(ON) <1 Ω VSS1 1 16 VSS2 Value Proposition TSD 2V ADuM4146 VI+ 2 1 CLAMP 2 2 ► Drive Ideal for SiC Devices VI– 3 UVLO LOGIC 15 GATE_SENSE ▪ High drive strength (4A peak) READY 4 MASTER MASTER 14 VOUT_ON ▪ High CMTI (150kV/μs) 2 FAULT 5 1 LOGIC PR
Slide 23: AD7606B / AD7606C-16 / AD7606C-18 8-Channel Simultaneous Sampling DAS
AD7606B / AD7606C-16 / AD7606C-18 8-Channel, Simultaneous Sampling, Bipolar, 16/18-Bit DAS AD7606B AD7606C Resolution 16b 16/18b Input Impedance 5 MΩ 1.25 MΩ Throughput Rate 800 kSPS 1 MSPS TUE ‘total 0.05% max; –40°C to +125°C unadjusted error’ SNR 93.5dB 102dB 22 kHz and 3 dB Bandwidth 22 kHz 220
Slide 24: Inverter Test Power Supplies and Communications
Inverter Test Power Supplies and Communications CT/xMR/Hall 3- Phase 440V Mains Vout+ Diodes or /220V ~ IGBT or Up to ~ SiC /110V ~ 1200V Switches x2-3 x2-3 Shunt Vout- Vsense+ +12V Half-Bridges Smoothing Circuit H-Bridge Resistor Resistor AC to DC -12V Dividers Dividers Conversion 5V Vsense- Resist
Slide 25: Application Example: Datalogger & Protocol Analyzer
► Overview of Test & Measurement Application Challenges for Electric Vehicles Example: ► Application Examples ▪ Hardware in the Loop ▪ Dynamic Power Supply: Inverter Test Datalogger & Protocol ▪ Datalogger & Protocol Analyzer Analyzer ► Wrap-Up and Q&A 25 | ©2021 Analog Devices, Inc. All rights rese
Slide 26: Datalogger/Protocol Analyzer
Datalogger/Protocol Analyzer ► A device that monitors and records digital and analog signals in a vehicle for diagnostic, repair, or optimization purposes CHALLENGES ► More Sensors, Controls, and Interfaces ► Evolving Standards and Requirements Faster signal bandwidths and increased Maintain support
Slide 27: Datalogger and Protocol Analyzer Diagram
Datalogger and Protocol Analyzer Diagram Temperature LDO Switching Voltage Regulator Regulator Current Digital I/O ► ADI Value Proposition Analog I/O Fault ADC Protected CAN FD / XL I2C / SPI / LVDS Amp Switch ▪ Compact Integrated Isolated Communications Fault ▪ Multi-Channel ADCs DAC Protected LVDS
Slide 28: Interface and Isolation Recommended Products
Interface and Isolation Recommended Products Transceiver With With Isolation Isolated DCDC RS-485 ADM3065E ADM2763E ADM2867E CAN LTC2875 ADM3058E ADM3055E isoPower® RS-232 LTC2873 LTC2873+ LTC2873+ iCoupler® (with RS485) ADuM141D ADuM6421A isolated isolation DC-DC USB ADuM4160 LTM2884 SPI ADuM141D A
Slide 29: ADM3058E: Signal Isolated CAN FD Transceiver
ADM3058E: Signal Isolated CAN FD Transceiver Reinforced Pin-Compatible Upgrade to the TI ISO1042 ► Value Proposition 1500 VPEAK working voltage ► CAN FD compliant isolated transceiver up to 12 Mbps ► Passes EN 55032/CISPR 32 Class B emissions on a 2-layer board ► Increased robustness with IEC61000-4
Slide 30: AD7124-4/AD7124-8 Low Noise, Low Power 24-Bit Σ-Δ ADC
AD7124-4/AD7124-8 4-channel and 8-channel Low Noise, Low Power, 24-Bit Σ-Δ ADC with PGA and Reference ► Highest level of signal chain integration with complete AFE on-chip ► Lowest power: up to 40% power savings when compared to current solutions from ADI and the competition ► Integrated diagnostic
Slide 31: ADG5421F: Amplifier and ADC Input Protection
ADG5421F: Amplifier and ADC Input Protection Overvoltage Protection Switch Vdd Vss Vdd + 0.7 V Vin (V) Vout (V) Vin Vout Vdd Vdd FF t Fault 500 ns t Input Fault Voltage/Current Blocked Overvoltage Detection Guaranteed Off with No Power Latch-Up Immune 31 | ©2021 Analog Devices, Inc. All rights reser
Slide 32: ADG5401F: Amplifier and DAC Output Protection
ADG5401F: Amplifier and DAC Output Protection VDD VSS ADG5401F VIN V VOUT V(VOUT) D S POC VDD DFB SFB VIN V(D) FF Fault IN t Fault Overvoltage Protection Fault Voltage/Current Blocked Overvoltage Detection Feedback Channel Open-Loop Prevention Power-On Condition 32 | ©2021 Analog Devices, Inc. All r
Slide 33: Evaluation Tools
Evaluation Tools EVAL-AD7124-8-PMDZ EVAL-ADM3055E-ARDZ EVAL-ADICUP3029 AD7124-8 PMOD EVAL_ADICUP3029 Demo 33 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 34: Overview of Test & Measurement Challenges for Electric Vehicles
► Overview of Test & Measurement Challenges for Electric Vehicles ► Application Examples ▪ Hardware in the Loop ▪ Dynamic Power Supply: Inverter Test ▪ Datalogger & Protocol Analyzer ► Wrap-Up and Q&A 34 | ©2021 Analog Devices, Inc. All rights reserved.
Slide 35: Test and Measurement Enabling an EV Future
Test and Measurement Enabling an EV Future ► Hardware in the Loop ► Dynamic Power Supply for Inverter Test ► Datalogger & Protocol Analyzer Additional Topics for Future Webinars ► Battery Cell, Module and Pack Test ► ADAS Module and System Test ► Battery Formation ► Analog Design and Simulation Tool