Aehr Test Systems · NASDAQ:AEHR

Aehr Test Systems — LD Micro Main Event (October 2021)

16 slides from Aehr Test Systems's conference presentation, Oct 12, 2021

  1. Slide 1: Setting the Test Standard for Tomorrow

    Setting the Test Standard for Tomorrow Nasdaq: AEHR

  2. Slide 2: Forward Looking Statements

    Forward Looking Statements This presentation contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties includ

  3. Slide 3: Aehr Test Systems Company Overview

    Aehr Test Systems Company Overview Production Semiconductor Test & Burn-in for over 40 Years!  World-wide leader in packaged part and wafer-level burn-in and test Packaged Part Test & Burn-in Production systems Wafer Level Test  Unique full-wafer test and burn-in Production systems and contactors

  4. Slide 4: Worldwide Customer Base

    Worldwide Customer Base Aehr Test Headquarters, Fremont California Aehr has been a leader in burn-in test solutions for over 40 years with thousands of systems shipped worldwide (Partial Customer List)

  5. Slide 5: WW Semiconductor Test Market TAM

    WW Semiconductor Test Market TAM  Total Semiconductor Test Market ~ $9B in 2020  ~ $4B in Test Systems  ~ $1B in wafer level device “probers”  ~ $1B in packaged part device “handlers”  ~ $1.5B in Probe Cards (contact of die in wafer form)  ~ $1.5B in Test & Burn-in Boards and Sockets (contact

  6. Slide 6: Aehr Test Systems' Market Drivers

    Aehr Test Systems’ Market Drivers Need for cost-efficient burn-in & testing is growing rapidly due to increasing IC complexity, costs, miniaturization, and mission-critical functionality  Electrification of Vehicles driving new Silicon Carbide based power conversion that requires stress / burn-in t

  7. Slide 7: Testing without Compromise

    Testing without Compromise Reliability, Stress, and DFT Testing without compromise  Solutions for package parts, modules, panels, or wafers allow testing at optimal process point  Confirm which devices received desired test with per device measurements, monitoring, & feedback  100% traceability w

  8. Slide 8: Production Burn-in / Reliability Test Options

    Production Burn-in / Reliability Test Options Singulated Die Single Die Package Singulated Die Singulated System Module /Product/PCB Module “Panel” Wafer Singulated Die System in Package

  9. Slide 9: Solutions from Wafer to Package Parts

    Solutions from Wafer to Package Parts Wafers Module “Wafer” Die/Modules Package Parts WaferPaks DiePaks Burn-in Boards

  10. Slide 10: Wafer Level vs Package Level Burn-in Flow

    Wafer Level vs Package Level Burn-in Flow Packaged Part Burn-In Test Flow Die Test 1 Die Test 2 Packaging Pkg Test 1 PPBI Pkg Test 2 Aehr Test FOX-XP Die Test 1 with Burn-In Die Test 2 Packaging Pkg Test 1 Pkg Test 2 Wafer Level Burn-In Test Flow

  11. Slide 11: Aehr Wafer Level Test & Burn-in Patents

    Aehr Wafer Level Test & Burn-in Patents  WaferPak temperature control methods  Vacuum & pressure-based WaferPaks  Maintaining probe contact over temp  Electrical components in WaferPak  Individual DUT power supplies  Per Die Current Protection  Redundant power supplies  Portable WaferPaks 

  12. Slide 12: FOX-P Family of Test & Burn-in Systems

    FOX-P Family of Test & Burn-in Systems Solutions for Engineering to Production CP NP XP Single Wafer Stepping Dual WaferPak & Dual DiePak Multi WaferPak & Multi DiePak Test & Burn-In System Test & Burn-In System Test & Burn-In System FOX- P WaferPak Contactors FOX- P DiePak Carrier

  13. Slide 13: FOX-XP Multi-Wafer Production Test & Burn-In System

    FOX-XP Multi-Wafer Production Test & Burn-In System  9 / 18 Wafer System High Volume Production  100% compatible using the same resource options as FOX-NP and FOX- CP blades up to 2 kW per blade  Delivers up to 2,048 independent universal channels or 1,024 High current or high voltage channels pe

  14. Slide 14: Electric Vehicles and Silicon Carbide WLTBI

    Electric Vehicles and Silicon Carbide WLTBI  Aehr has demonstrated and begun shipping in volume a world leading solution for multi-wafer full wafer level test and burn-in (WLTBI) of up to 18 wafers per system  Aehr has booked over $40M with its lead customer for silicon carbide in the first 4 mont

  15. Slide 15: Aehr Fremont Applications Lab

    Aehr Fremont Applications Lab  FOX-XP Multi-Wafer WLTBI System  FOX-NP Dual-Wafer WLTBI System  FOX-CP Single Wafer Test Burn-in System with integrated high-power thermal chuck fully automated wafer prober  FOX WaferPaks, DiePaks, & TLBs  FOX WaferPak Automated Aligner  FOX WaferPak Manual Ali

  16. Slide 16: Setting the Test Standard for Tomorrow

    Setting the Test Standard for Tomorrow Nasdaq: AEHR

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