Slide 1: Fundamentals of AEC-Q100: What "Automotive Qualified" Really Means
Fundamentals of AEC-Q100: What “Automotive Qualified” Really Means Richard Oshiro, Director, QMS-Automotive November 2018
Slide 2: MPS Automotive Background
MPS Automotive Background 80 AEC Orderables Automotive Spiked Out in $120M+ Company Earnings, $53M Flip-Chip First Q100 Flip-Chip Part, Packaging Qualified MPQ4470 240+ AEC Products 200M Units Shipped 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 AEC Participation World’s Most Compact First Func
Slide 3: Richard Oshiro – Director, QMS, Automotive
Richard Oshiro – Director, QMS, Automotive • Nearly 20 years experience in Automotive Quality • Currently responsible for MPS Automotive Quality as well as our Quality Management System. Representative for MPS on Automotive Electronics Council • 11+ years as Director of Quality at Cypress Semiconduc
Slide 4: Agenda
Agenda The Who/What/Why’s of AEC The Many AEC-Qxxx Standards AEC-Q100: Temperature Grades AEC-Q100: Key Reliability Tests Spotlight on HTOL, ELFR, PTC, TC, HAST Beyond AEC: STRM, Road Test, EVB BI MPS Consumer / Industrial / Automotive Grades Compared
Slide 5: Background: Automotive Ecosystem
Background: Automotive Ecosystem PCN guidelines
Slide 6: Who is AEC?
Who is AEC? Automotive Tier-1 Suppliers Semiconductor Suppliers
Slide 7: Automotive vs. Consumer
Automotive vs. Consumer Consumer Automotive Ambient Temperature Range 0° to 85°C -40°C to 150°C Expected Operating Life 2-3 years 10 years+ Acceptable Failure Rates 300 parts per million Zero Supply Lifetime 2-3 years 15-20 years
Slide 8: Why AEC-Q100 Qualification is Needed
Why AEC-Q100 Qualification is Needed Automotive companies sell millions of very expensive vehicles – to some people this means they think they can sue them for a lot of money Automotive buyers have increased their quality requirements, partly due to automotive company’s own advertisements Example 10
Slide 9: Reliability Bathtub Curve
Reliability “Bathtub Curve” Covered with “Safe Launch” Protocols Failure Rate Early Infant Mortality Failures Wear-Out Failures Covered with AEC-Q100 Qualification The Constant “Bathtub” / Random Failures Time
Slide 10: The Many AEC-Q Standards
The Many AEC-Q Standards AEC-Q100 AEC-Q101 AEC-Q102 AEC-Q200 AEC-Q104 (New) Additional Standards AEC - Q100-007 - Rev-B: Fault Simulation and Test Grading AEC - Q101 Rev - D1: Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors (base document) AEC - Q100-008 - Rev-A: Early
Slide 11: AEC-Q100 Key Figures & Grades
AEC-Q100 Key Figures & Grades 3 Number of unique lots tested Ambient Temperature Range 77 Sample size per lot Grade 3 -40° to 85°C 1000h Accelerated tests duration Grade 2 -40° to 105°C Minimum CPK for distribution related Grade 1 -40° to 125°C 1.67 parameters 0 Number of fails allowed Grade 0 -40°
Slide 12: AEC-Q100 Key Test Categories
AEC-Q100 Key Test Categories Accelerated Environment Stress Accelerate Lifetime Simulation Packaging/Assembly Die Fabrication Electrical Verification Defect Screening Cavity Package Integrity
Slide 13: AEC-Q100: Key Reliability Tests
AEC-Q100: Key Reliability Tests Accelerated Environment Stress Tests Electrical Verification •Preconditioning •Pre- and Post- Stress Function Parameter •Temperature-Humidity-Bias (THB) / Biased Highly Accelerated Stress •ESD – HBM/CDM Test (HAST) •Latch-Up •Autoclave (AC) / Unbiased (HAST) •Electric
Slide 14: HTOL vs. ELFR
Table 2: Qualification Test Methods (continued) TEST GROUP B - ACCELERATED LIFETIME SIMULATION TESTS STRESS ABV # NOTES SAMPLE SIZE / LOT NUMBER OF LOTS ACCEPT CRITERIA TEST METHOD ADDITIONAL REQUIREMENTS High Temperature Operating Life HTOL BI 7 0 Fails JEDEC JESD22-A108 For devices containing NVM,
Slide 15: PTC
Table 2: Qualification Test Methods (continued) TEST GROUP A- ACCELERATED ENVIRONMENT STRESS TESTS (CONTINUED) SAMPLE NUMBER ACCEPT TEST STRESS ABV # NOTES SIZE/LOT | OF LOTS CRITERIA METHOD ADDITIONAL REQUIREMENTS PC before PTC for surface mount devices. Test required only on devices with maximum r
Slide 16: Table 2: Qualification Test Methods (continued)
Table 2: Qualification Test Methods (continued) TEST GROUP A - ACCELERATED ENVIRONMENT STRESS TESTS (CONTINUED) SAMPLE | NUMBER | ACCEPT TEST srstontses ers a NOTES | size/Lot | oFLOTS | CRITERIA METHOD ADDITIONAL REQUIREMENTS PC before TC for surface mount devices. Grade 0: -55°C to +150°C for 2000
Slide 17: HAST
HAST Table 2: Qualification Test Methods TEST GROUP A - ACCELERATED ENVIRONMENT STRESS TESTS SAMPLE NUMBER ACCEPT STRESS ABV # NOTES SIZE /LOT OF LOTS CRITERIA TEST METHOD ADDITIONAL REQUIREMENTS For surface mount devices, PC before AC (121°C/15psig Autoclave or for 96 hours) or unbiased HAST (120°C
Slide 18: Process/Design Change Impact on AEC-Q100
Process/Design Change Impact on AEC-Q100 Highly Recommended
Slide 19: FAQ About AEC-Q100 Qual
FAQ About AEC-Q100 Qual • Do all qualification tests have to be performed for every new device? • How long is qualification data valid?
Slide 20: End Product: Qual Report in PPAP
End Product: Qual Report in PPAP
Slide 21: Beyond Q100: EVB Burn-In
Beyond Q100: EVB Burn-In • 80 application evaluation boards • 1000 hours • 125°C ambient temperature – 150’C junction temperature • Fully operational (switching)
Slide 22: Beyond Q100: Road Test & EMC
Beyond Q100: Road Test & EMC • 300-point application road test • Grade 1: 25°C, -55°C, 150°C for margin • Tests include stability/margin, ripple, fault response, load dump, cold crank • CISPR25 radiated & conducted emissions testing MPS EMI Lab Hangzhou, China
Slide 23: Beyond Q100: Short Term Reliability Monitoring
Beyond Q100: Short Term Reliability Monitoring Short Term Reliability Monitoring Criteria Preconditioning (3x Reflow) 96-Cycle Temperature Cycling (-65° to 150°C) 48h Autoclave Final Test Lot Accepted
Slide 24: MPS Product Grades
MPS Product Grades Consumer Industrial Automotive Product Qualification Standard JEDEC JEDEC AEC-Q100 Qual Tri-Temp Application Road Test Supply Dedicated Fab / Assembly Chain Specialized Tools / Personnel Process Enhanced Process Controls* Ultra-Enhanced Process Controls* Test Lot Size Restriction
Slide 25: Thank You – Q&A
Thank You – Q&A Additional resources: http://www.aecouncil.com For more information, contact: automotive@monolithicpower.com Check out our AEC-Q100 Power Management Solutions at MonolithicPower.com