Slide 1: Building the Next Generation Test Method Standard: Matching the production environment with in-house testing
Agenda Building the Next Generation Test Method • Introduction Standard: Matching the production • Current Standards environment with in-house testing • Improved Setup • Results Jason Mroczkowski (Cohu) • Conclusion • Next Steps Virtual Event ● May 11-13, 2020 Building the Next Generation Test Metho
Slide 2: Vision / Many Existing Life Cycle Standards
Vision Many Existing Life Cycle Standards Courtesy life cycle panel member TestConX 2019 • Create a method for testing and qualifying new contact technologies that matches onsite production qualifications and minimizes time to market (TTM) and cost of test (COT) 3 2 • Work with anyone interested 4 –
Slide 3: Example Life Cycle Standard / New Life Cycle Testing Introduction
Example Life Cycle Standard New Life Cycle Testing Introduction • FReD (Force Resistance Deflection) Tester: • Current Vendor Test Standard • Next Generation Test Setup – Keithley source meter, force sensor, 3 axis robotic system (Spec Sheet) – Device plating • Standardized cycle test fixtures – har
Slide 4: Next Generation Life Cycle Test Setup
Next Generation Life Cycle Test Setup Next Generation Life Cycle Test Setup • Detailed Handling Architecture Socket • Base System with fanout – Socket on hinged and sealed top plate – Cohu Jaguar Data Acquisition PCB Software and – Plunger Handler (sans Power DVM • Holds contact material (Sn, NiPd,
Slide 5: Next Gen Life Cycle Test Equipment Specs / Results: Temperature Test
Next Gen Life Cycle Test Equipment Specs Results: Temperature Test • Temperature range • Current pulses • Temperature impact on contact – -40 °C till 160 °C – minimum time length 0.1 ms, maximum resistance – LN2 required for cold current 250 A) – lowest contact resistance at lowest temp – Current ap
Slide 6: Results: Contact Element Wear
Results: No Current applied vs. Duty Cycle Current Results: Contact Element Wear – Wear and tear detection for full – Effects of pulsed current temperature range (10% @ 5A) on resistance • Measure tip wear after cycling measurement – Search for first contact 0K – Higher contact resistance – Search f
Slide 7: Example: Kelvin Probe on NiPdAu / cRes vs. Force on Matte Tin
Example: Kelvin Probe on NiPdAu Example: cRes vs. Force on Matte Tin – One Pin measured up to 1M cycles – 8A 20ms pulse • Setup – 32 pins 100K insertions – 2% duty cycle – Matte tin lead frame – Contact material – Apply 1.6 A for 5 seconds on each • NiPdAu plated panel probe during each insertion @
Slide 8: Example: cRes vs Force on Matte Tin / Cleaning Impact
Example: cRes vs Force on Matte Tin Example: Cleaning Impact – Automated contactor cleaning pad on plunger • Force • Resistance: – Pin 1-4 30 g Pin 5-8 36 g – Pin 1-4 30 g Pin 5-8 36 g – Set cleaning interval based on cRes limit – Compare different cleaning intervals Cleaned Building the Next Genera
Slide 9: Conclusion / Next Steps
Conclusion Next Steps • Current cycle testing setups do not capture full production environment and therefore specified life cycles do not match production results 1. Increase channel count 2. Add multichannel current • The Cohu solution presented captures all critical variables including DUT pulser
Slide 10: Copyright Notice
COPYRIGHT NOTICE This multimedia file is copyright © 2020 by TestConX. All rights reserved. It may not be duplicated or distributed in any form without prior written approval. The content of this presentation is the work and opinion of the author(s) and is reproduced here as presented at the 2020 Te