Monolithic Power Systems, Inc. · NASDAQ:MPWR
Monolithic Power Systems — Technical Presentation (November 2021)
17 slides from Monolithic Power Systems's technical presentation, November 2021
Slide 1: Practical and Early Testing Showcases: Roots of EMI (Part 1)
Practical and Early Testing Showcases Roots of EMI (Part 1) November 2021 rev 20180504
Slide 2: Why Is EMI Important? – Functional Point of View
Why Is EMI Important? – Functional Point of View Products need to work in rough environments without emitting too much noise, which can effect other products The product/system needs to be robust The emitted noise enough to work in and disturbances rough radio service, of the wireless service, produ
Slide 3: Why Is EMI Important? – Economic Point of View
Why Is EMI Important? – Economic Point of View Poor EMI results could negatively affect the success of a product, and potentially the entire company. To be successful in But you can only sell Addressing EMI is the long term, you your products if you essential to fulfill must be able to sell fulfill
Slide 4: Practical and Early Testing
Practical and Early Testing How does EMC become a success factor for your design project? Understanding the Roots and Thinking about EMI from the Clearly Structured EMC Background of EMI and the Beginning of the Project Development Process Defined Requirements • Obtain the requirements for the • Com
Slide 5: Conduct pre-tests by evaluating components
Practical and Early Testing Conduct pre-tests by evaluating components to find the appropriate functional, thermal, and EMI viewpoints • Talk with your suppliers about layout requirements, mandatory components, options, and different operation modes o How to set the switching frequency? How to choos
Slide 6: Plan EMC tests during development and testing loops
Practical and Early Testing Plan EMC tests during development (early stages) and testing loops • Leave room for additional filtering and modifications to the first layout for investigations during pre-testing • Get in touch with the lab and define a test plan for the test session o Talk about requir
Slide 7: Plan EMC tests during development and testing loops
Practical and Early Testing Plan EMC tests during development (early stages) and testing loops • Take all documents and spare parts with you to the lab o Datasheets of the used components + schematic + layout o Reference board from old measurements and/or previous internal measurements o Take spare
Slide 8: Overview – Test Methods (Automotive)
Overview – Test Methods (Automotive) 108MHz 200MHz 400MHz 100kHz 150kHz 30MHz 80MHz 1GHz 6GHz 9kHz 3GHz DC Emissions – Automotive Conducted Emissions (CE) – CISPR25 – Voltage Method Conducted Emissions (CE) – CISPR25 – Current Probe Method Radiated Emissions (RE) – CISPR25 – ALSE Method Radiated Emi
Slide 9: Conducted Emissions
Conducted Emissions You should be able to put the DUT in a functional status, like it would be in the real application, with the worst-case operation for emissions testing. PC EMI Receiver LISN Layout Robustness Input Filter DUT LISN Housing Components SW Conducted Emissions (CE) measurements gives
Slide 10: Conducted Emissions 0.15kHz to 30MHz
Slide Conducted Title Emissions Conducted Emissions 0.15kHz to 30MHz AVG Detector 400kHz with Spread Spectrum 70 dBµV 60 50 Layout 40 30 Robustness Input Filter 20 10 0 -10 Housing Components -20 -30 100kHz 30MHz Frequency Sub-range 1 Component Component Layout Input Filter Layout Results Initial Se
Slide 11: Conducted Emissions 30MHz to 110MHz
Conducted Slide Title Emissions Conducted Emissions 30MHz to 110MHz AVG Detector 400kHz with Spread Spectrum 15 dBµV 14 13 12 Layout 11 10 9 Robustness Input Filter 8 7 6 5 Housing Components 4 3 2 30MHz 110MHz Frequency Sub-range 2 Component Component Layout Input Filter Layout Results Initial Set-
Slide 12: Conducted Emissions 0.1kHz to 110MHz
Slide Conducted Title Emissions Conducted Emissions 0.1kHz to 110MHz AVG Detector 400kHz with Spread Spectrum Layout Robustness Input Filter Housing Components Component Component Results Initial Set-Up Without CINs Mod 1 With CINs - 15dB
Slide 13: Radiated Immunity
Radiated Immunity You should be able to put the DUT in a functional status, like it would be in the real application, and monitor all relevant signals to understand the effect on the disturbance if an unexpected event occurs. PC Basic Set-Up Antenna / Clamp / Direct Coupling Monitoring Layout Robust
Slide 14: Immunity Behavior: Robustness Against Disturbances
Immunity Slide TitleBehavior Robustness Against Disturbances 40 30 20 Layout Test Level [dbm] 10 0 Robustness Input Filter -10 -20 -30 Housing Components -40 Frequency [MHz] DUTY TSET EN/DIM VIN SW FAULT VCC IREF ISET NTC LIMIT Some pins of an IC are sensitive per definition. Sensitive pins must be
Slide 15: EMC Lab – Ettenheim, Germany
EMC Lab – Ettenheim, Germany • Opened in June 2021 • Built from January 2020 to June 2021 • Office, meeting rooms, seminar rooms, and an EMC lab in 1,900sqm - 40 km to Freiburg - 100 km to Basel - 170 km to Stuttgart - 235 km to Frankfurt
Slide 16: EMC Lab – Ettenheim, Germany: Chambers
EMC Lab – Ettenheim, Germany CISPR25 Chamber For emissions and immunity testing of automotive electronics SAC3 Chamber For emissions and immunity testing of CISPR 25 automotive, industrial, and consumer SAC3 electronics Shielded Chamber Shielded- Chamber Pulses Industrial Pulses Automotive For condu
Slide 17: EMC Lab – Ettenheim, Germany
EMC Lab – Ettenheim, Germany
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