Agilent Technologies, Inc. · NYSE:A
Agilent Technologies — Technical Presentation (February 2005)
41 slides from Agilent Technologies's technical presentation, February 2005
Slide 1: Portfolio Applications
Portfolio Applications SPI, AOI, AXI, & ICT A status report on what we are doing! (Some of these ideas may not materialize!)
Slide 2: Portfolio Applications Topics
Portfolio Applications Available and under development Topics • Introduction • Closed loop • Test Strategy Tool • Coverage Tool • Unified Repair Ticket (URT) • Summary Page 2
Slide 3: Agilent Medalist Test and Inspection Family
Agilent Medalist Test and Inspection Family How do you get more value from the Agilent portfolio? Tools available and under development Page 3
Slide 4: Closed Loop (early prototype)
Closed Loop (early prototype) Potential Attribute Feedback from AXI, AOI and ICT to P&P and Screen Printer Measurement Feedback from AOI and maybe AXI to P&P & screen printer Page 4
Slide 5: Closed Loop
Closed Loop Fundamental methodology of defect prevention R12 R7 R33 Board 1 Board 8 Board 21 Reference Package Defect type P&P#2/Feeder Designator Form Track R7 R33 R12 0402 Missing off-set skew 73 Page 5
Slide 6: Closed Loop
Closed Loop Where do placement defects happen most often The 3 key areas in a P&P machine that causes variation are: • X-Y Gantry (Require measurement data, Cpk, X mean + SD charts) - Gantry/head may have drifted in x, y, Theta direction, and needs calibration • Individual feeders (Require attribute
Slide 7: Proposed defect prevention use-model
Proposed defect prevention use-model Process Manager Process Engineer Technician Real time Factory level monitoring Real time line/product level monitoring Real time monitoring using Pareto charts By Factory/line By line/product By Feeders FPY and DPMO by line/product Using drill down’s to establish
Slide 8: Topics
Topics • Introduction • Closed loop • Test Strategy Tool • Coverage Tool • Unified Repair Ticket (URT) • Summary Page 8
Slide 9: Today we have many test strategy options
Today we have many test strategy options Customer Functional Test ICT AXI post-wave Manual Visual Inspection AOI post-reflow AOI pre-reflow AXI post-reflow SPI What is the right test/inspection strategy? Where is the right place for test/inspection? Page 9
Slide 10: A simple example
A simple example Introduced AND can PCBA be detected 1,000 SMT joints 4 Defect types DPMO Paste P&P Reflow 100 SMT components - Bridges Joint 100 20% 10% 70% 2,000 Board volume - Opens Joint 200 10% 30% 60% - Insufficient Joint 200 30% 10% 60% Opportunities - Missing c. Component 500 0% 90% 10% 2,00
Slide 11: A simple example
A simple example Introduced AND can PCBA be detected 1,000 SMT joints 4 Defect types DPMO Paste P&P Reflow 100 SMT components - Bridges Joint 100 20% 10% 70% 2,000 Board volume - Opens Joint 200 10% 30% 60% - Insufficient Joint 200 30% 10% 60% Opportunities - Missing c. Component 500 0% 90% 10% 2,00
Slide 12: A simple example
A simple example Paste P&P Reflow - Bridges 40 20 140 - Opens 40 120 240 - Insufficient 120 40 240 - Missing c. 0 90 10 Paste P&P AOI Reflow ICT FT Customer Introduced AND can be detected Defects Paste P&P Reflow - Bridges 200 40 20 140 - Opens 400 40 120 240 - Insufficient 400 120 40 240 - Missing
Slide 13: A simple example
A simple example Paste P&P Reflow - Bridges 40 20 140 - Opens 40 120 240 - Insufficient 120 40 240 - Missing c. 0 90 10 FT considered Bridges 60 Bridges 158 Bridges 6 Opens 160 Opens 304 Opens 73 Insufficient 160 Insufficient 352 Insufficient 317 Missing c. 90 Missing c. 11 Missing c. 3 Paste P&P AO
Slide 14: A simple example
A simple example Paste P&P Reflow - Bridges - Opens The Test Strategy Tool 40 40 20 120 140 240 - Insufficient 120 40 240 - Missing c. • Can use up to 30 defect types 0 90 10 FT considered Bridges 60 Bridges 158 Bridges 6 Opens 160 Opens 304 Opens 73 (around 10 are recommended) Insufficient 160 Insu
Slide 15: Select Dataset
Select Dataset 'w, Agilent Test Strategy Tool (Revision 0.8) E (oO) x) File Help Cs a y Main: j Select data set. Default ast Start ast Default. ast is a comect data set! Select this data set Medalist G4 Pla ss ~ - F Solutions for Success 7 & ; ~ Agilent Technologies in a Changing World m ‘ny wg
Slide 16: Entering DPMO values
Entering DPMO values 's. Agilent Test Strategy Tool (Re: 15) x! File Help Main | PCBA | | | Defect coverage and Repair costs | (Defect spectrum, DPMO levels, and where defects are intioduced fm ect out of atoll of 11 defect es defined Where defects are introduced, must add up to 100% DPMO} Paste FiC
Slide 17: Entering coverage values
Entering coverage values Page 17
Slide 18: Entering PCBA values
Entering PCBA values Agilent Test Strategy Tool (Revision 0.8) 3 =/0) x) File Help Main PCBA | Sequences | Test Costs | Defect coverage and Repair costs | Defect spectrum, DPMO, and Where | Analyze and Results | y Select or Describe board Board name: | Volume: frooo0 (Volume is estimate of total fe
Slide 19: Entering Test strategies
Entering Test strategies Page 19
Slide 20: A simple example
A simple example Paste P&P Reflow Cost of programming, fixtures, - Bridges 40 20 140 - Opens 40 120 240 and capital cost - Insufficient 120 40 240 - Missing c. 0 90 10 FT considered Bridges 60 Bridges 158 Bridges 6 Opens 160 Opens 304 Opens 73 Insufficient 160 Insufficient 352 Insufficient 317 Missi
Slide 21: Entering test cost
Entering File Help test cost , Agilent Test Strategy Tool (Revision 0.8) Main | PCBA | Sequences Test Costs | Defect coverage and Repair costs | Defect spectrum, DPMO, and Where | Analyze and Flesuls | Test Coverage: (0 - 100%) 86% Cost per board: ($] not including retest pos Calculated Test Costs B
Slide 22: Analyze
‘=. Agilent Test Strategy Tool (Revision 0.8) - (oi x) Fle Help Main | PCBA | Sequences| Test Costs | Defect coverage and Repair costs | Defect spectrum, DPMO, and Wher Analyze and Result Status [Sc ha [Waiting for user _ ig) =. Select report =|) x} an Datastig WATestStiateayTool Select reports and
Slide 23: Results
Results Written into an Excel Test strategies and test times spreadsheet For board type: Example Strategy # Step Side 1 2 3 Included Time * Included Time * Included Time * 10 Paste First X X X 40 Pick&Place First X X X 70 Reflow First X X X 80 MVI3 First X 30 90 AOI First X 20 X 20 100 Paste Second
Slide 24: Results
Results Total test and repair costs per board (NRE-model) $50.00 $45.00 $40.00 $35.00 $30.00 False calls False calls $25.00 Diagnostic Diagnostic and& repair repair Run time costs Run time cost $20.00 $15.00 $10.00 $5.00 $0.00 1 2 3 Page 24
Slide 25: Results
Results Estimated yields 100% 90% 80% 70% 60% Strategy 1 50% Strategy 2 Strategy 3 40% 30% 20% 10% 0% MVI3 1st AOI 1st MVI3 2nd AOI 2nd AXI ICT FT Customer Page 25
Slide 26: Results
Results Escaped defects 5000 4500 4000 3500 3000 # of defects Strategy 1 2500 Strategy 2 Strategy 3 2000 1500 1000 500 0 Bridges Opens Insufficient Missing Misaligned Orientation Damaged & Other Exessive Wrong Other solder defective termination solder component component component defects defects Pa
Slide 27: Summary
Summary • The Test Strategy Tool is based on Agilent’s research and studies of defect levels, test effectiveness, and test strategies. • Given reasonably accurate input data the tool is the most effective to analyze different test strategy scenarios and their economic impacts. • Tool can be used as
Slide 28: Topics
Topics • Introduction • Closed loop • Test Strategy Tool • Coverage Tool • Unified Repair Ticket (URT) • Summary Page 28
Slide 29: Coverage Tool
Coverage Tool Idea: to build on 3070 Coverage analyst PCOLA - SOQ and add 5DX and SJ50 coverage. Reading 3070, 5DX NDF files, SJ50 special file Present results in an Excel file “What-if I added another tester?” Objective is to show users how the portfolio of products gives higher coverage and optimi
Slide 30: PCOLA - SOQ
PCOLA - SOQ If a test/inspection passes what does that mean? Device scores P - Presence C - Correct component O - Orientation (90,180, 270 degrees off) L - Live (basic function) A - Alignment Joint score S - Short O - Open Q - Quality Perfect score is 100,000 (not achievable) Page 30
Slide 31: Coverage Tool output
Coverage Tool output Agilent Test Coverage Analysis Board: ABC-001A Date 15-Jan-05 Device analysis Score ALL AOI - SJ50 AXI - 5DX ICT - 3070 Device = 88,000 73,000 46,000 44,000 Connection 99,355 63,065 97,419 75,484 ALL AOI - SJ50 AXI - 5DX ICT - 3070 Device Include 1 Include 1 Include 1 Number Ref
Slide 32: Topics
Topics • Introduction • Closed loop • Test Strategy Tool • Coverage Tool • Unified Repair Ticket (URT) • Summary Page 32
Slide 33: Unified Repair Ticket (URT)
Unified Repair Ticket (URT) URT Idea: to merge defect “tickets” from AOI, AXI and ICT and produce a single Unified repair ticket Feed this back to ITF/ART with “real defects” only View all defects in ART Reduce false calls, escapes Make N testers behave like 1 tester Page 33
Slide 34: URT Merge results
URT Merge results Preliminary … Reduces calls by > 50% Simple rules: Eliminate duplicates. If >50% joint defects: Missing If Missing, skip all other defects Works across all testers, but mainly AOI/AXI Page 34
Slide 35: Traditional Process Flow
Traditional Process Flow AOI (1) AOI (2) AXI ICT Retest View & Repair View & Repair View & Repair Repair Remaining Page 35
Slide 36: URT Optimum Process Flow
URT Optimum Process Flow URT AOI (1) AOI (2) AXI ICT Retest View & Repair Repair Critical Remaining with Confidence Page 36
Slide 37: URT Possible Process Flows
URT Possible Process Flows URT AOI (1) AOI (2) AXI ICT Retest View & FC View & FC View & Repair Repair Critical Remaining View & Repair View & Repair with Repair Some Confidence Repair All Page 37
Slide 38: URT Benefits
URT Benefits Reduce false calls How? – Learning, have all defects tied together Post Processing • Missing parts vs. many opens • Outliers, voids Reduce handling Postpone repair Postpone defect viewing No increase in escapes Page 38
Slide 39: URT Costs
URT Costs Increased focus on process Must have barcodes, reduced tolerance to read failures Possible process changes Additional application to maintain Page 39
Slide 40: Topics
Topics • Introduction • Closed loop • Test Strategy Tool • Coverage Tool • Unified Repair Ticket (URT) • Summary Page 40
Slide 41: Summary
Summary • Agilent is working on improving the value of the SPI – AOI – AXI – ICT portfolio • Closed loop – Under development Alfa testing • Test Strategy Tool - Available • Coverage Tool – Under development • Unified Repair Ticket (URT) – Feasibility studies • We need partners for checking ideas, Al
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