Jedat Inc. · TSE:3841
Jedat — Pollen Metrology — Technical Presentation (February 2026)
32 slides from Jedat's technical presentation, Feb 3, 2026
Slide 1: Webinar #2 Collaborative AI Software Layer for Metrology
Webinar #2 Collaborative AI Software Layer for Metrology 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 1
Slide 2: Speakers
Speakers 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 2
Slide 3: Webinar #2 – Agenda
Webinar #2 – Agenda Duration: 45min Collaborative AI Software Layer for Metrology 30min Introduction to Collaborative AI used in industrial environments Overview of how state of the art AI and Data Science techniques can automate metrology on Microscopy images boosting measurement quality and quanti
Slide 4: 1. Context of Data Analytics for Semiconductor Process Control
1. Context of Data Analytics for Semiconductor Process Control 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 4
Slide 5: Innovative Materials Ecosystem Data Flow
Innovative Materials Ecosystem Data Flow Traditional Engineer-Driven Materials Development From fragmented data to actionable process intelligence Without shared analytics, engineers cannot fully leverage either wheel Simulation R&D and Production line Process Process Process Process parameters mode
Slide 6: Semiconductor Manufacturing Fab Software Stack
Semiconductor Manufacturing Fab Software Stack Example of data flow management Data lives in five layers — engineers must bring it together YMS Yield Analytics Yield Management System ADC Data quality & Defect Intelligence Automatic Defect Classification MES Fab Orchestration Manufacturing Exec. Sys
Slide 7: Semiconductor Fabs Global
Semiconductor Fabs Global Three departments. One process reality Disconnected analytics prevent cross-department learning IC Makers GLOBAL QUALITY & RELIABILITY Customers & Fabless • Failure • Root cause analysis Updates models / Recipes / analysis • Reliability monitoring Defect / Excursions / Cont
Slide 8: Artificial Intelligence has reached industrial maturity for process control
Artificial Intelligence has reached industrial maturity for process control Accelerate process development and maximize yield with a scalable solution Hardware + Software + Data Intelligence 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 8
Slide 9: Augmenting Engineers With a Continuous AI-Driven Development Loop
Augmenting Engineers With a Continuous AI-Driven Development Loop But maturity does not come from AI alone — it comes from how AI is integrated into engineering loops Simulation R&D and Production line Process Process Experts Process Process parameters modelling DOE tool logfile knowledge Wheel of f
Slide 10: AI Is Already Embedded in Industrial Workflows
Why This Matters: AI Is Already Embedded in Industrial Workflows The real challenge is not deploying AI — it’s orchestrating it Industrial Need AI Technology Key Benefits Examples Real-time analytics of Breaks silos, boosts Collaborate across teams Collaborative AI SEM, TEM, Optical (…) images produ
Slide 11: 2. Our vision and mission
2. Our vision and mission 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 11
Slide 12: Pollen - Collaborative AI for Process Control
Pollen - Collaborative AI for Process Control AI-Driven Software for Next-Generation Manufacturing Bridging Data Silos in Material Science with Collaborative AI for Yield Enhancement • Who we are Founded in 2014, Pollen is a software company based in Grenoble, France, with a team of 20 experts dedic
Slide 13: The Sixth Layer: Orchestrating All AI Technologies Seamlessly
The Sixth Layer: Orchestrating All AI Technologies Seamlessly Smart3 – AI Orchestration Layer connecting R&D, Manufacturing & Quality GLOBAL QUALITY & RELIABILITY IC Makers & Fabless • Failure • Root cause analysis Customers analysis • Reliability monitoring Updates models / Recipes / • Failure proc
Slide 14: Smart3 seamlessly integrates with tool software
Smart3 seamlessly integrates with tool software Smart3 – Secured Application Software Layer for Tool Suppliers TOOL SUPPLIER ECOSYSTEM TOOL APPLICATION SOFTWARE SMART3 AI Capabilities - SECURED APPLICATION SOFTWARE LAYER - - inside Smart3 - • Metrology / Inspection logic (Embedded alongside tool sof
Slide 15: Comprehensive Smart3 Software Suite to Boost the Production of Semiconductor Devices
Comprehensive Smart3 Software Suite to Boost the Production of Semiconductor Devices Focus of this Webinar Metrology Two adoption models Inspection 1. Turnkey AI-Driven Process Control Software Process Optimization 2. Smart3 as a Low-Code SDK Framework to accelerate 10×+ internal application develop
Slide 16: 3. Industry challenges and AI for Metrology
3. Industry challenges and AI for Metrology 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 16
Slide 17: Problems to solve
Problems to solve Focused on Metrology Time-pressure - Long measurement time - Costly expert time (engineers, data scientists) Process complexity - Objects composed of various materials - Image quality reaching limits of microscopes Low ROI from data - Data underused - Manual measurement reducing da
Slide 18: Problems to solve
Problems to solve Focused on Metrology Time-pressure - Long measurement time Annotations - Costly expert time (engineers, data scientists) Process complexity - Objects composed of various materials - Image quality reaching limits of microscopes Image Segmentation Low ROI from data - Data underused -
Slide 19: Annotations
Annotations AI Assisted tools for annotation: • Contour fitting models • Foundation models such as Segment Anything Model Challenge: • Ease annotation process to improve data quantity Gains: + Time gain + User bias reduction + Annotations quality + Annotations quantity 2/3/2026 POLLEN WEBINAR 2 - CO
Slide 20: Image segmentation
Image segmentation Image segmentation to automate metrology • Object detection to find rough location • Instance segmentation to delineate precisely objects • Semantic segmentation to delineate materials Challenge: • Integration of these tools with no code for the users and minimal amount of annotat
Slide 21: Automatic custom measurements
Automatic custom measurements Complex measurement recipes are needed: • Constraints between figures can be defined in GUI • Measurements can be defined on figures (area, perimeter, roughness, …) • Automatic adaptation of constraints and measurements on new objects Challenge: • Customization of strat
Slide 22: 4. Use Cases & Demo
4. Use Cases & Demo 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 22
Slide 23: Demo plan
Demo plan 1. Collaborative Platform, example SAM implementation 2. Turnkey solution for Metrology (Machine Learning) 3. Annotations & Deep learning 4. Collaborative Workflow Strategy 5. Implementation for HVM 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 23
Slide 24: 1- Collaborative Platform Example Video
1- Collaborative Platform Example Video Plugin Manager Ease of use internal library to customize Smart3 platform without any software developement https://youtu.be/UJ0uPbH8o_c 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 24
Slide 25: 2- Turnkey solution for Metrology
2- Turnkey solution for Metrology Process # Yield Process 1 Process 2 YIELD ENHANCEMENT Slant 2D Meta-structure TopDown CDSEM TopDown CDSEM Analysis can be: • CNN, R-CNN Computing • Third Party softwares • Internal Software Code Post computing ADI Metrology AEI Metrology User results database 3D Ana
Slide 26: 3- Annotations & Deep learning Example Video
3- Annotations & Deep learning Example Video https://youtu.be/Vct-sDr5r1k 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 26
Slide 27: 4- Collaborative Workflow Strategy Videos
4- Collaborative Workflow Strategy Videos SmartOEM3: Collaborative AI at the Service of Supplier IP Wavefront Phase Imaging https://wooptix.com/ https://youtu.be/f9SHO3FzMoo?si=s9fCFa1Q6Ia9BsKO Atomic Force Microscope https://www.infinitesima.com/ https://youtu.be/TzAr2V1mmkg 2/3/2026 POLLEN WEBINAR
Slide 28: 5- Implemention for HVM – Example Video
5- Implemention for HVM – Example Video Use the API https://youtu.be/a2GJeazDVZo 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 28
Slide 29: 5. Next Webinars, Q&A
5. Next Webinars, Q&A 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 29
Slide 30: Next Webinars
Next Webinars Webinar 1 – Dec 2 (2025): Collaborative AI for Next-Gen Semi Manufacturing - A Software Platform Revolution Webinar 2 – Feb 3 (2026): Collaborative AI Software Platform for Metrology 2026 – Q1 Webinar 3: Monday Feb. 16: Collaborative AI for Automatic Defect Classification Webinar 4: Tu
Slide 31: Any question?
Any question? Seminar slides access , please send an email to contact@pollen-metrology.com 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 31
Slide 32: Thank you
Thank you 2/3/2026 POLLEN WEBINAR 2 - COLLABORATIVE AI FOR METROLOGY 32
Pollen Metrology — Technical Presentation (February 2026) on 6ix