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Nova's Materials Metrology Solution Selected by an Additional Leading Memory Customer
REHOVOT, Israel, April 2, 2019 /PRNewswire/ -- Nova (Nasdaq: NVMI) today announced that a leading global Memory manufacturer recently selected its latest
About this update from Nova Ltd.
[{"type":"text","content":"REHOVOT, Israel, April 2, 2019 /PRNewswire/ -- Nova (Nasdaq: NVMI) today announced that a leading global Memory manufacturer recently selected its latest X-Ray materials metrology solution for high volume manufacturing in its advanced fabrication lines. This win adds a new name to our growing materials metrology customer base and solidifies Nova's unique leadership position for materials metrology in the Memory segment. The company expects to recognize initial revenues from this win in the first quarter of 2019 and forecasts additional orders throughout 2019 as the customer expands the solution to additional applications and sites. \nThe selection is for Nova's new VeraFlex III+ XF, the latest generation of in-line X-ray photoelectron spectroscopy (XPS) metrology solution, which combines additional X-ray florescence (XRF) capability. The advanced platform embeds an innovative HW design to provide customers with maximum flexibility to improve sensitivity, precision and overall system productivity for a wide application range in advanced Memory nodes.\n\"We are committed to provide the world's largest IC manufacturers with tools that enable unique performance of the highest degree\" said Adrian Wilson, General Manager of the Materials Metrology Division of Nova. \"We are very proud that our in-line XPS platform has now become a tool of record in all major leading Memory customers, allowing them to solve growing process challenges resulting from the introduction of new materials engineering techniques. Our advanced X-Ray capabilities for composition and thickness intersect our customers growing investment in breakthrough materials to enhance device performance beyond traditional architectural enhancements.\" \nAbout Nova: Nova is a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing. Nova delivers continuous innovation by providing state-of-the-art high-performance metrology solutions for effective process control throughout the semiconductor fabrication lifecycle. Nova's product portfolio, which combines high-precision hardware and cutting-edge software, provides its customers with deep insight into the development and production of the most advanced semiconductor devices. Nova's unique capability to deliver innovative X-ray and Optical solutions enable its cus...