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Nordson TEST & INSPECTION Showcases State-of-the-Art Inspection and Metrology Solutions at SEMICON Taiwan
MINNEAPOLIS--(BUSINESS WIRE)-- Nordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the
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[{"type":"text","content":" MINNEAPOLIS--(BUSINESS WIRE)--\nNordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the semiconductor industry. The company will be showcasing its state-of-the-art inspection and metrology solutions, including the CyberOptics SQ3000™+ Multi-Function system, the new Quadra 7 Pro Manual X-ray Inspection (MXI) System, and the revolutionary WaferSense® Auto Teaching System™ (ATS2). The event will take place from Sept. 6-8, 2023 at TaiNEX 1&2 in Taipei.\n\nThis press release features multimedia. View the full release here: https://www.businesswire.com/news/home/20230828874751/en/Nordson TEST & INSPECTION's Quadra 7 Pro MXI (Photo: Business Wire)\nThe new Quadra 7 Pro MXI system sets a new standard for 3D/2D manual inspection in back-end semiconductor applications. Powered by the revolutionary Onyx® detector technology, it delivers exceptional image clarity and reduced noise levels, elevating the inspection experience to new levels of precision and efficiency.\n\n\nEquipped with the latest Dual Mode Quadra NT4® tube, the Quadra 7 Pro provides users with maximum flexibility. This innovative feature offers brightness and resolution modes, allowing operators to dynamically switch between them based on specific application requirements.\n\n\nEnhancing the Quadra 7 Pro's capabilities is the newly developed Revalution™ software, tailored specifically for high-end semiconductor applications. With an intuitive interface, optimized workflow, and expanded functionality, Revalution™ software empowers operators to efficiently analyze and interpret inspection data, contributing to faster decision-making and improved overall productivity.\n\n\nThe CyberOptics SQ3000™+ Multi-Function system is designed for high-end applications, including advanced packaging, mini-LED, advanced SMT, and 008004/0201 SPI. This all-in-one solution offers unmatched accuracy and high speed, utilizing an even higher resolution Multi-Reflection Suppression® (MRS®) sensor that effectively eliminates reflection-based distortions caused by shiny components and specular surfaces.\n\n\nThe WaferSense® Auto Teaching System™ (ATS2) is a multi-camera sensor that, when used in conjunction with CyberSpectrum™ software, enables accurate wafer hand-off calibration for semiconductor tool alignment and setup for front-end ...