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Aehr Test : to Participate in the 23rd Annual Craig-Hallum Institutional Investor Conference on May 28
Aehr Test : to Participate in the 23rd Annual Craig-Hallum Institutional Investor Conference on May
About this update from Aehr Test Systems
[{"type":"text","content":"\n Aehr Test Systems to Participate in the 23rd Annual Craig-Hallum Institutional Investor Conference on May 28\n \n May 21, 2026\n Investor Conferences, News, Press Releases\n Comments Off on Aehr Test Systems to Participate in the 23rd Annual Craig-Hallum Institutional Investor Conference on May 28Fremont, CA (May 21, 2026) - Aehr Test Systems (NASDAQ: AEHR), a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence (AI), silicon photonics, data center, automotive, and industrial applications, today announced that CFO Chris Siu will be participating in one-on-one meetings with institutional investors at the 23rd Annual Craig-Hallum Institutional Investor Conference taking place Thursday, May 28, 2026 at the Depot Renaissance Hotel in Minneapolis.\n \n \n For additional information, or to schedule a meeting with Aehr Test Systems, please contact your Craig-Hallum representative, or Aehr's investor relations firm, PondelWilkinson, Inc., at [email protected].\n About Aehr Test Systems\n Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and packaged part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, advanced artificial intelligence (AI) processors, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr's products and solutions. Aehr has developed and introduced several innovative products including the FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full-wafer contact and singulated die/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontr...