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Aehr Test Systems to Participate in the Craig-Hallum Alpha Select Conference in New York on November 17, 2022

FREMONT, Calif., Nov. 10, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification

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Aehr Test Systems to Participate in the Craig-Hallum Alpha Select Conference in New York on November 17, 2022

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[{"type":"text","content":"FREMONT, Calif., Nov. 10, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will participate in the Craig-Hallum 13th Annual Alpha Select Conference taking place on November 17, 2022 at the Sheraton New York Times Square Hotel. President and CEO Gayn Erickson and CFO Ken Spink will be hosting meetings with institutional investors throughout the day. “We look forward to discussing our semiconductor wafer level and singulated die test and burn-in solutions and the markets they serve with investors,” said Mr. Erickson. “We continue to be excited about the silicon carbide market for electric vehicles and electrification of the worldwide infrastructure, as well as gallium nitride that is used in both consumer applications and for photovoltaic and automotive applications. Aehr Test provides complete production solutions for improving yield and reliability of semiconductors, and devices such as silicon carbide semiconductors used in electric and hybrid electric vehicles, silicon photonics devices used in data centers and 5G infrastructure, and 2D/3D and other sensors used in mobile and wearable applications, which are expected to be significant revenue drivers for our products this fiscal year and next.” For additional information, or to schedule a meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr’s investor relations firm, MKR Investor Relations, at [email protected]. About Aehr Test SystemsHeadquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in semiconductor devices in wafer level, singulated die, and package part form, and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX-P™ families of test and burn-in systems and FOX WaferPak™ Aligner, FOX WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing o...

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