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Aehr Test Systems to Announce Fiscal 2021 Fourth Quarter and Full Year Financial Results on July 15, 2021
FREMONT, Calif., July 08, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification
About this update from Aehr Test Systems
[{"type":"text","content":"FREMONT, Calif., July 08, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will report financial results for its fiscal 2021 fourth quarter and full year ended May 31, 2021 on Thursday, July 15, 2021 following the close of the market. The Company will host a conference call and webcast at 5:00 p.m. Eastern time to discuss the results. What:Aehr Test Systems fourth quarter fiscal 2021 financial results conference call. When:Thursday, July 15, at 5:00 p.m. Eastern Time (2:00 p.m. PT). Dial in Number:To access the live call, dial 800-367-2403 (US and Canada) or +1 334-777-6978 (International) and give the participant passcode 9748167. Webcast: To access the live webcast, please visit the investor relations section at www.aehr.com. Call Replay:A phone replay of the call will be available approximately two hours following the end of the call through 8:00 p.m. ET on Thursday, July 22, 2021. To access the replay dial-in information, please click here. About Aehr Test SystemsHeadquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compac...